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0 · iT300 Scanning Electron Microscope from JEOL
1 · JSM
$13K+
dior 2021春夏
iT300 Scanning Electron Microscope from JEOL
Low Vacuum Mode (LV) Low vacuum pressure range from 10 to 650Pa extends the range of materials that can be readily observed. Specimen Navigation. Fully automated, 5 axis motor .The JSM-IT300HR is a new model of JEOL InTouchScope Series. Equipped with a new hig.The JSM-IT300HR is a new model of JEOL InTouchScope Series. Equipped with a new high-brightness electron gun and optical system, the JSM-IT300HR achieves superbly high-quality .
JSM
The JSM-IT300LV scanning electron microscope (SEM) from JEOL USA features an expanded pressure range, large specimen chamber and improved resolution for imaging and .
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput. Specimen . The iT300 features a newly-designed user interface that allows operations to be performed via a touch screen capabilities, maintaining ease-of-use. The New JSM-IT300 SEM .
Low Vacuum Mode (LV) Low vacuum pressure range from 10 to 650Pa extends the range of materials that can be readily observed. Specimen Navigation. Fully automated, 5 axis motor stage speeds up search for region of interest (ROI). Quickly reach the ROI from a color image using the Stage Navigation System (Option). Analysis.The JSM-IT300HR is a new model of JEOL InTouchScope Series. Equipped with a new high-brightness electron gun and optical system, the JSM-IT300HR achieves superbly high-quality imaging and analysis with high sensitivity and high spatial-resolution.
The JSM-IT300LV scanning electron microscope (SEM) from JEOL USA features an expanded pressure range, large specimen chamber and improved resolution for imaging and characterizing a variety of sample types and sizes.JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput. Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation.The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs. This all-new design builds upon the award-winning platform of the InTouchScope™ analytical SEM with intuitive touch screen control, and supersedes the widely used high-performance analytical SEM, the JSM-6610LV.The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs. This all-new design builds upon the award-winning platform of the InTouchScope™ analytical SEM with intuitive touch screen control, and supersedes the widely used high-performance analytical SEM, the JSM-6610LV.
大形試料室搭載. 最大8 inch φ× 80 mm Height の試料を挿入することのできる大型試料室になっています。 最大積載量2 kg も魅力です。 マルチパーパスチャンバー. アタッチメントポート位置の設計が最適化されたことにより、EDS/WDS/EBSD の同時装着が可能です。 EDS/EBSDは同一方向に装着できます。 また、対向型EDSも装着できるようになりました。 高速ステージ .In addition to the high image quality observation due to the improvement of the illuminating system, the vacuum system and the signal processing system, the JSM-IT300 is a Scanning Electron Microscope, which can be operated with a high throughput by using touch panel operation and the high speed stage. The JSM-IT300LV scanning electron microscope (SEM) from JEOL USA features an expanded pressure range, large specimen chamber and improved resolution for imaging and characterizing a variety of sample types and sizes. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter. Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface topography and contrast.
Low Vacuum Mode (LV) Low vacuum pressure range from 10 to 650Pa extends the range of materials that can be readily observed. Specimen Navigation. Fully automated, 5 axis motor stage speeds up search for region of interest (ROI). Quickly reach the ROI from a color image using the Stage Navigation System (Option). Analysis.The JSM-IT300HR is a new model of JEOL InTouchScope Series. Equipped with a new high-brightness electron gun and optical system, the JSM-IT300HR achieves superbly high-quality imaging and analysis with high sensitivity and high spatial-resolution.The JSM-IT300LV scanning electron microscope (SEM) from JEOL USA features an expanded pressure range, large specimen chamber and improved resolution for imaging and characterizing a variety of sample types and sizes.JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput. Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation.
The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs. This all-new design builds upon the award-winning platform of the InTouchScope™ analytical SEM with intuitive touch screen control, and supersedes the widely used high-performance analytical SEM, the JSM-6610LV.
The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten/LaB6 low vacuum SEMs. This all-new design builds upon the award-winning platform of the InTouchScope™ analytical SEM with intuitive touch screen control, and supersedes the widely used high-performance analytical SEM, the JSM-6610LV.大形試料室搭載. 最大8 inch φ× 80 mm Height の試料を挿入することのできる大型試料室になっています。 最大積載量2 kg も魅力です。 マルチパーパスチャンバー. アタッチメントポート位置の設計が最適化されたことにより、EDS/WDS/EBSD の同時装着が可能です。 EDS/EBSDは同一方向に装着できます。 また、対向型EDSも装着できるようになりました。 高速ステージ .
In addition to the high image quality observation due to the improvement of the illuminating system, the vacuum system and the signal processing system, the JSM-IT300 is a Scanning Electron Microscope, which can be operated with a high throughput by using touch panel operation and the high speed stage. The JSM-IT300LV scanning electron microscope (SEM) from JEOL USA features an expanded pressure range, large specimen chamber and improved resolution for imaging and characterizing a variety of sample types and sizes.
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